HERØHF™ High Frequency Spring Probes
HERØHF™ is a solution designed for test engineers working with high-frequency applications. This contactor offers unparalleled performance and reliability, making it an essential tool for demanding test environments.
High Frequency Capability: The contactor is engineered to handle high-frequency signals with minimal signal loss, ensuring accurate and reliable test results.
Spring Probe Design: Utilizing high-quality spring probes, the contactor offers optimal contact force to maintain reliable contact with test points.
Low Insertion Loss: The contactor's design minimizes insertion loss, preserving signal integrity and ensuring accurate measurement data.
Durable Construction: Built with robust materials, the contactor is capable of withstanding frequent use in challenging test environments.
Compatibility: The contactor is compatible with a wide range of test equipment, making it a versatile solution for various high-frequency testing applications.
- Suitable for BGA, LGA, QFN, and WLCSP applications.
- Designed with single-ended architecture to minimize Cres variability.
- Easy in-line cleaning with Pd alloy probe tips that stick out further than the competition.
- Very good compliance with a 1mm Test Height.
- All Contactors are available for Engineering test characterization with a Manual Actuator and are ready for high-volume automated testing.
Insertion Loss | -1dB up to 90GHz |
Temperature | -65°C to 155°C |
Cres | <100mΩ |
Contactor Life | 500,000 cycles |
Typical End-Use Applications
Our contacting solutions can be used in a wide range of applications, including but not limited to:
- Aerospace & Defense
- Automotive
- Computing and Network
- Consumer
- Industrial
- IoT
- Medical