HERØHF™ High Frequency Spring Probes

HERØHF™ is a solution designed for test engineers working with high-frequency applications. This contactor offers unparalleled performance and reliability, making it an essential tool for demanding test environments.

High Frequency Capability: The contactor is engineered to handle high-frequency signals with minimal signal loss, ensuring accurate and reliable test results.

Spring Probe Design: Utilizing high-quality spring probes, the contactor offers optimal contact force to maintain reliable contact with test points.

Low Insertion Loss: The contactor's design minimizes insertion loss, preserving signal integrity and ensuring accurate measurement data.

Durable Construction: Built with robust materials, the contactor is capable of withstanding frequent use in challenging test environments.

Compatibility: The contactor is compatible with a wide range of test equipment, making it a versatile solution for various high-frequency testing applications.

• Suitable for BGA, LGA, QFN, and WLCSP applications.
• Designed with single-ended architecture to minimize Cres variability.
• Easy in-line cleaning with Pd alloy probe tips that stick out further than the competition.
• Very good compliance with a 1mm Test Height.
• All Contactors are available for Engineering test characterization with a Manual Actuator and are ready for high-volume automated testing.