YARI^®

Johnstech International, a global leader in the semiconductor test industry, has added two spring probe product lines to their premium test portfolio. Engineered by industry experts with more than 30 years of spring pin design expertise, Johnstech’s YARI™ test solution offers a reliable, cost effective, top-of-the-line test contactor manufactured specifically for the highly competitive commercial test marketplace.

Available with crown and spear tips, the YARI product line is suitable for BGA, LGA, and QFN applications. Additionally, the YARI 4.5mm test height features a single-end architecture to maximize CRES stability, provide compliance flexibility, and frequency performance for both small and large array packages. Each solution is compatible with a floating alignment plate for accuracy and the Pd-alloy tip is easy-to-clean, lengthening MTBA.

• Pitches down to 0.3mm
• Larger packages needing greater compliance
• Large ball counts >400
• Environmental Temperature Range -60 to 175°C
• Reliability Typical Probe Life 500,000 cycles

All Contactors will be available for Engineering test/ Characterization with a Manual Actuator and are ready for high-volume Automated Testing.